Thermal Aware IR drop using Mesh Conforming Electro-Thermal Co-Analysis

被引:0
|
作者
Sercu, Jeannick [1 ]
Barnes, Heidi [1 ]
机构
[1] Keysight Technol, EEsof EDA, Santa Rosa, CA 95403 USA
来源
2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI) | 2017年
关键词
IR drop; Power Integrity; Electro-Thermal; Self-Heating; Power Distribution Network; Printed Circuit Board; PCB;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
PI engineers designing Power Distribution Networks (PDNs) apply electric IR drop analysis tools in order to optimize the supply voltage margins for the ICs mounted on the board. The IR drop is affected by the thermal conditions due to the temperature dependency of the material properties. Hence, including thermal effects in the IR drop analysis is important. Both the electric power dissipation inside the IC's and the Joule loss in the copper contribute to the generated heat. We use a finite element discretization technique to solve the coupled electric and thermal steady-state equations simultaneously. Our solution combines H(div) Whitney face elements with electro-thermal mesh conformity, preserving all geometrical details in both domains. The exchange of electric data (power loss) and thermal data (temperature) happens at the mesh level speeding up the solution process and increasing the accuracy of the simulations. The electro-thermal co-analysis technique is validated using a via test board and applied to the PandaBoard to demonstrate the significance of thermal aware IR drop.
引用
收藏
页数:4
相关论文
共 23 条
  • [1] Mesh Conforming Electro-Thermal Co-Analysis with Application to PCB Power Integrity
    Sercu, Jeannick
    Barnes, Heidi
    2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & SIGNAL/POWER INTEGRITY (EMCSI), 2017, : 585 - 590
  • [2] Analysis of Electro-thermal Instability in Bipolar Transistors
    Balanethiram, Suresh
    Chakravorty, Anjan
    PROCEEDINGS OF THE 2015 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2015, : 713 - 716
  • [3] Application of the Latency Insertion Method to Electro-Thermal Circuit Analysis
    Klokotov, D.
    Schutt-Aine, J.
    Beyene, W.
    Mullen, D.
    Li, M.
    Schmitt, R.
    Yang, L.
    2011 IEEE 20TH CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS (EPEPS), 2011, : 263 - 266
  • [4] Construction and Application of Electro-Thermal Co-simulation Platform
    Pan, Zhengwei
    Luo, Jian
    Dong, Changcheng
    Liu, Xuguang
    Wang, Rui
    Yao, Erxian
    2020 IEEE 2ND INTERNATIONAL CONFERENCE ON CIRCUITS AND SYSTEMS (ICCS 2020), 2020, : 15 - 19
  • [5] Analysis of Electro-Thermal Characterization of Substrate Integrated Suspended Line
    Meng, Shiqiang
    Ma, Kaixue
    Wang, Yongqiang
    2022 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS 2022), 2022, : 371 - 374
  • [6] Electro-thermal based junction temperature estimation model and thermal performance analysis for IGBT module
    Xin, Xin
    Zhang, Chengning
    Zhao, Jing
    2017 20TH INTERNATIONAL CONFERENCE ON ELECTRICAL MACHINES AND SYSTEMS (ICEMS), 2017,
  • [7] Automatic Electro-Thermal Analysis in Mentor Graphics PCB Design System
    Petrosjanc, K. O.
    Kozynko, P. A.
    14TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATION OF ICS AND SYSTEMS, 2008, : 76 - 79
  • [8] System-Level Electro-Thermal Analysis of RDS(ON) for Power MOSFET
    Murugan, Rajen
    Ai, Nathan
    Kao, C. T.
    2017 THIRTY-THIRD ANNUAL SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM (SEMI-THERM), 2017, : 52 - 56
  • [9] Electro-thermal Analysis of a 65 nm Channel MOSFET Under The HPEMP
    Li, Yong
    Xie, Haiyan
    Yan, Hui
    Wang, Jianguo
    2020 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO 2020), 2020,
  • [10] Electro-thermal analysis of non-rectangular FinFET and modeling of fin shape effect on thermal resistance
    Karimi, Fa.
    Orouji, Ali A.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2017, 90 : 218 - 227