Silicon Carbide (SiC) Nanoelectromechanical Antifuse for Ultralow-Power One-Time-Programmable (OTP) FPGA Interconnects

被引:11
作者
He, Tina [1 ]
Zhang, Fengchao [1 ]
Bhunia, Swarup [1 ]
Feng, Philip X. -L. [1 ]
机构
[1] Case Western Reserve Univ, Case Sch Engn, Dept Elect Engn & Comp Sci, Cleveland, OH 44106 USA
来源
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2015年 / 3卷 / 04期
基金
美国国家科学基金会;
关键词
Antifuse; field-programmable gate array (FPGA); nanoelectromechanical systems (NEMS); silicon carbide (SiC); programming voltage; ultralow power; MEMS;
D O I
10.1109/JEDS.2015.2421301
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report a new nanoscale antifuse featuring low-power and high-programming speed, by employing silicon carbide (SiC) nanoelectromechanical systems (NEMS). We show that the SiC NEMS antifuses can enable ultralow-power one-time-programmable (OTP) field-programmable gate arrays (FPGAs) with characteristics promising for security-sensitive and harsh-environment applications. The SiC NEMS antifuses offer minimal leakage, low-programming voltage (down to similar to 1.5 V), ideally abrupt transient, high on/off ratios (>10(7)) and high-current carrying ability (>10(6) A/cm(2)), and very small footprints (similar to 1 mu m(2) to similar to 0.1 mu m(2) per device). We further describe new designs of antifuses, simulate FPGA benchmarking circuits based on experimentally demonstrated practical NEMS antifuses, and compare their advantageous performance with state-of-the-art conventional antifuse FPGAs. We also demonstrate a SiC NEMS antifuse-based OTP memory cell with a read margin of > 10(6).
引用
收藏
页码:323 / 335
页数:13
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