Carbon nanotube electronics

被引:104
作者
Appenzeller, J [1 ]
Knoch, J
Martel, R
Derycke, V
Wind, SJ
Avouris, P
机构
[1] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] MIT, Cambridge, MA 02139 USA
关键词
carbon nanotube; field-effect transistor (FET); low-dimensional system; Schottky barrier;
D O I
10.1109/TNANO.2002.807390
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present experimental results on single-wall carbon nanotube field-effect transistors (CNFETs) operating at gate and drain voltages below 1 V. Taking into account the extremely small diameter of the semiconducting tubes used as active components, electrical characteristics are comparable with state-of-the-art metal oxide semiconductor field-effect transistors (MOSFETs). While output as well as subthreshold characteristics resemble those of conventional MOSFETs, we find that CNFET operation is actually controlled by Schottky barriers (SBs) in the source and drain region instead of by the nanotube itself. Due to the small size of the contact region between the electrode and the nanotube, these barriers can be extremely thin, enabling good performance of SB-CNFETs.
引用
收藏
页码:184 / 189
页数:6
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