Effects of vicinal steps on the island growth and orientation of epitaxially grown perylene-3,4,9,10-tetracarboxylic dianhydride (PTCDA) thin film crystals on a hydrogen-terminated Si(111) substrate

被引:8
作者
Sazaki, G
Fujino, T
Usami, N
Ujihara, T
Fujiwara, K
Nakajima, K
机构
[1] Tohoku Univ, Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Ctr Interdisciplinary Res, Aoba Ku, Sendai, Miyagi 9808578, Japan
关键词
control of grain orientation; epitaxial structure; hydrogen-terminated Si(111); molecular beam epitaxy; orgnic semiconductor; PTCDA;
D O I
10.1016/j.jcrysgro.2004.09.082
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
On flat and off-cut Si(1 1 1) substrates terminated with monohydride, thin film crystals of organic semiconductor perylene-3,4,9,10-tetracarboxylic dianhydride (PTCDA) were grown by molecular beam epitaxy (MBE) and were observed by atomic force microscopy (AFM). The thin film crystals on the hydrogen-terminated Si(1 1 1) surface (H-Si(1 1 1)) have a mesa-type island shape. On the flat H-Si(1 1 1) (average step distance > 500 rim, off-angle < 0.04degrees), with an increase in a thin film thickness, the size and number of the PTCDA islands were increased and decreased, respectively. These results show that the islands coalesced during the growth. After the coalescence of the islands, some islands became single crystals and the others became polycrystals. The ratio of the single crystal islands was estimated from the shapes of the islands. We found that the ratio of the single crystal islands after the coalescence was 48% and this value was much larger than a probability (1/6) estimated from an epitaxial relation. This result suggests that Ostwald ripening occurred in the PTCDA/H-Si(1 1 1) system. The PTCDA thin film crystals were also grown on the off-cut H-Si(1 1 1) (average step distance = 10 nm, off-angle = 1.8degrees). The number of the islands was much larger than that on the flat H-Si(1 1 1) and this result shows that the vicinal steps on the surface can work as effective nucleation sites. Coalescence of the islands was also observed on the off-cut H-Si(I 1 1). After the coalescence, the ratio of the single crystal islands on the off-cut H-Si(1 1 1) was 10% larger than that on the flat H-Si(1 1 1). This result shows that the orientation of the PTCDA islands can be controlled using the vicinal steps on the Substrate surface. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:594 / 602
页数:9
相关论文
共 28 条
[21]   Analysis of the three-dimensional structure of a small crystallite by scanning tunneling microscopy:: Multilayer films of 3,4,9,10-perylenetetracarboxylic-dianhydride (PTCDA) on Cu(110) [J].
Stöhr, M ;
Gabriel, M ;
Möller, R .
EUROPHYSICS LETTERS, 2002, 59 (03) :423-429
[22]   EFFECT OF SEVERAL ORGANIC BUFFER LAYERS ON TTF-TCNQ EPITAXIAL-GROWTH [J].
SUMIMOTO, T ;
KUNIYOSHI, S ;
KUDO, K ;
TANAKA, K .
MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1994, 247 :225-231
[23]   MOLECULAR-ORIENTATION AND ANISOTROPIC PHOTOCONDUCTION OF EVAPORATED OLIGO-P-PHENYLENE SULFIDE FILMS [J].
TAKIMOTO, A ;
WAKEMOTO, H ;
OGAWA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (02) :971-978
[24]   STM CHARACTERIZATION OF ORGANIC-MOLECULES ON H-TERMINATED SI(111) [J].
UDER, B ;
LUDWIG, C ;
PETERSEN, J ;
GOMPF, B ;
EISENMENGER, W .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1995, 97 (03) :389-390
[25]  
UEDA Y, 1994, J ELECTRON MICROSC, V43, P99
[26]   PURIFICATION AND CHARACTERIZATION OF PHTHALOCYANINES [J].
WAGNER, HJ ;
LOUTFY, RO ;
HSIAO, CK .
JOURNAL OF MATERIALS SCIENCE, 1982, 17 (10) :2781-2791
[27]   Direct observation of surface diffusion of large organic molecules at metal surfaces: PVBA on Pd(110) [J].
Weckesser, J ;
Barth, JV ;
Kern, K .
JOURNAL OF CHEMICAL PHYSICS, 1999, 110 (11) :5351-5354
[28]   Aggregation mechanism in fullerene thin films on several substrates [J].
Yase, K ;
Ara-Kato, N ;
Hanada, T ;
Takiguchi, H ;
Yoshida, Y ;
Back, G ;
Abe, K ;
Tanigaki, N .
THIN SOLID FILMS, 1998, 331 (1-2) :131-140