Nanometer-scale imaging with an ultrafast scanning tunneling microscope

被引：39

作者：

Steeves, GM ^{[1
]}

Elezzabi, AY

Freeman, MR

机构：

[1] Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada

[2] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 2J1, Canada

来源：

APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 04期

关键词：

D O I：

10.1063/1.120798

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present experimental data demonstrating the spatial resolution of an ultrafast junction mixing scanning tunneling microscope (JM-STM). The experiment uses a patterned metal-on-metal (Ti/Au) surface to establish electronic structure contrast on a short length scale. Our measurements achieve a spatio-temporal resolution of 20 nm-20 ps, Limited only by the sample properties. The fine spatial resolution proves that the time-resolved signal is generated in the tunnel junction, indicating that atomic resolution should be possible in the JM-STM mode of operation. (C) 1998 American Institute of Physics.

引用

页码：504 / 506

页数：3

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