Nanometer-scale imaging with an ultrafast scanning tunneling microscope

被引：38
|
作者：
Steeves, GM [1 ]
Elezzabi, AY
Freeman, MR
机构：
[1] Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada
[2] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 2J1, Canada
来源：
APPLIED PHYSICS LETTERS | 1998年 / 72卷 / 04期
关键词：
D O I：
10.1063/1.120798
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We present experimental data demonstrating the spatial resolution of an ultrafast junction mixing scanning tunneling microscope (JM-STM). The experiment uses a patterned metal-on-metal (Ti/Au) surface to establish electronic structure contrast on a short length scale. Our measurements achieve a spatio-temporal resolution of 20 nm-20 ps, Limited only by the sample properties. The fine spatial resolution proves that the time-resolved signal is generated in the tunnel junction, indicating that atomic resolution should be possible in the JM-STM mode of operation. (C) 1998 American Institute of Physics.
引用
收藏
页码：504 / 506
页数：3
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