Reflection High Energy Electron Diffraction (RHEED) Study of Nanostructures: From Diffraction Patterns to Surface Pole Figures

被引：0

作者：

Tang, Fu ^{[1
]}

Lu, Toh-Ming ^{[1
]}

Wang, Gwo-Ching ^{[1
]}

机构：

[1] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA

来源：

ELECTRON CRYSTALLOGRAPHY FOR MATERIALS RESEARCH AND QUANTITATIVE CHARACTERIZATION OF NANOSTRUCTURED MATERIALS | 2009年 / 1184卷

关键词：

AREA DETECTOR; THIN-FILMS; GROWTH;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this report we present a brief overview of the growth of nanostructures by the oblique angle deposition where the nanostructures possess both out-of-plane and in-plane preferred orientations or a biaxial texture. The degree of preferred crystal orientations can be quantitatively determined from a method called "RHEED surface pole figure analysis" that we developed recently.

引用

页码：85 / 90

页数：6

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