Synthesis and structural characterization of Al4SiC4-homeotypic aluminum silicon oxycarbide, [Al4.4Si0.6][O1.0C2.0]C

被引:12
作者
Kaga, Motoaki [1 ]
Iwata, Tomoyuki [1 ]
Nakano, Hiromi [2 ]
Fukuda, Koichiro [1 ]
机构
[1] Nagoya Inst Technol, Dept Environm & Mat Engn, Nagoya, Aichi 4668555, Japan
[2] Toyohashi Univ Technol, Cooperat Res Facil Ctr, Toyohashi, Aichi 4418580, Japan
基金
日本学术振兴会;
关键词
Crystal structure; Powder diffraction; Rietveld method; New material; Aluminum silicon oxycarbide; Al4SiC4; POWDER DIFFRACTION; C SYSTEM; MEM;
D O I
10.1016/j.jssc.2010.01.012
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
A new quaternary layered oxycarbide, [Al439(5)Si0 (61(5))](Sigma 5)[O1 00(2)C2 00(2)](Sigma 3)C, has been synthesized and characterized by X-ray powder diffraction, transmission electron microscopy and energy dispersive X-ray spectroscopy (EDX). The title compound was found to be hexagonal with space group P6(3)/mmc, Z=2, and unit-cell dimensions a=0 32783(1)nm, c=2 16674(7)nm and V=0.20167(1)nm(3). The atom ratios Al Si were determined by EDX, and the initial structural model was derived by the direct methods. The final structural model showed the positional disordering of one of the three types of Al/Si sites The maximum-entropy methods-based pattern fitting (MPF) method was used to confirm the validity of the split-atom model, in which conventional structure bias caused by assuming intensity partitioning was minimized The reliability indices calculated from the MPF were R-wp=3 73% (S=1.20), R-p=2.94%, R-B = 1.04% and R-F =081% The crystal was an inversion twin Each twin-related individual was isostructural with Al4SIC4 (space group P6(3)mc, Z=2). (C) 2010 Elsevier Inc All rights reserved
引用
收藏
页码:636 / 642
页数:7
相关论文
共 19 条
  • [1] EXPO:: a program for full powder pattern decomposition and crystal structure solution
    Altomare, A
    Burla, MC
    Camalli, M
    Carrozzini, B
    Cascarano, GL
    Giacovazzo, C
    Guagliardi, A
    Moliterni, AGG
    Polidori, G
    Rizzi, R
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1999, 32 : 339 - 340
  • [2] THE BETA-REVERSIBLE-ALPHA'-PHASE TRANSITION OF SR2SIO4 .1. ORDER-DISORDER IN THE STRUCTURE OF THE ALPHA'-FORM AT 383-K
    CATTI, M
    GAZZONI, G
    IVALDI, G
    ZANINI, G
    [J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1983, 39 (DEC): : 674 - 679
  • [3] STRUCTURE TIDY - A COMPUTER-PROGRAM TO STANDARDIZE CRYSTAL-STRUCTURE DATA
    GELATO, LM
    PARTHE, E
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 (02) : 139 - 143
  • [4] X-RAY CRYSTALLOGRAPHIC DATA ON ALUMINUM SILICON-CARBIDE, ALPHA-AL4SIC4 AND AL4SI2C5
    INOUE, Z
    INOMATA, Y
    TANAKA, H
    KAWABATA, H
    [J]. JOURNAL OF MATERIALS SCIENCE, 1980, 15 (03) : 575 - 580
  • [5] First discovery and structural characterization of a new compound in Al-Si-O-C system
    Iwata, Tomoyuki
    Kaga, Motoaki
    Nakano, Hiromi
    Fukuda, Koichiro
    [J]. JOURNAL OF SOLID STATE CHEMISTRY, 2009, 182 (08) : 2252 - 2260
  • [6] MEM-based structure-refinement system REMEDY and its applications
    Izumi, F
    Kumazawa, S
    Ikeda, T
    Hu, WZ
    Yamamoto, A
    Oikawa, K
    [J]. EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2001, 378-3 : 59 - 64
  • [7] Three-dimensional visualization in powder diffraction
    Izumi, Fujio
    Momma, Koichi
    [J]. APPLIED CRYSTALLOGRAPHY XX, 2007, 130 : 15 - 20
  • [8] JEFEEREY GA, 1966, ACTA CRYSTALLOGR, V20, P538
  • [9] 2AL4C3.SIC - A NEW INTERMEDIATE PHASE IN THE AL-SI-C SYSTEM
    KIDWELL, BL
    ODEN, LL
    MCCUNE, RA
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (DEC) : 481 - 482
  • [10] LEBAIL A, 1988, MAT RES B, V23, P452