Reliability Analysis and Performance Degradation of a Boost Converter

被引:60
作者
Alam, Mohammed Khorshed [1 ]
Khan, Faisal H. [1 ]
机构
[1] Univ Utah, Dept Elect & Comp Engn, Power Engn & Automat Res Lab, Salt Lake City, UT 84112 USA
关键词
Closed-loop systems; condition monitoring; failure analysis; reliability theory; switch-mode dc-dc converters; POWER CONVERTERS; ORIENTED DESIGN; TOPOLOGIES;
D O I
10.1109/TIA.2014.2319587
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In general, power converters are operated in closed-loop systems, and any characteristic variations in one component will simultaneously alter the operating point of other components, resulting in a shift in overall reliability profile. This interdependence makes the reliability of a converter a complex function of time and operating conditions; therefore, the application may demand periodic replacement of converters to avoid downtime and maintenance cost. By knowing the present state of health and the remaining life of a power converter, it is possible to reduce the maintenance cost for expensive high-power converters. This paper presents a reliability analysis for a boost converter, although this method could be used to any power converter being operated using closed-loop controls. Through the conducted study, it is revealed that the reliability of a boost converter having control loops degrades with time, and this paper presents a method to calculate time-varying reliability of a boost converter as a function of characteristic variations in different components in the circuit. In addition, the effects of operating and ambient conditions have been included in the reliability model as well. It was found that any increase in the ON-state resistance of the MOSFET or equivalent series resistance of the output capacitor decreases the overall reliability of the converter. However, any variation in the capacitance has a more complex impact on the converter's reliability. This paper is a step forward to the power-converter reliability analysis because the cumulative effect of multiple degraded components has been considered in the reliability model.
引用
收藏
页码:3986 / 3994
页数:9
相关论文
共 39 条
[1]   Reliability Comparison of Boost PFC Converter in DCM and CCM Operating Modes [J].
Abdi, B. ;
Ranjbar, A. H. ;
Milimonfared, J. ;
Gharehpetian, G. B. .
2008 INTERNATIONAL SYMPOSIUM ON POWER ELECTRONICS, ELECTRICAL DRIVES, AUTOMATION AND MOTION, VOLS 1-3, 2008, :939-943
[2]  
[Anonymous], 2012, AN0994 INT RECT
[3]   An Adaptive Digital PID Controller Scheme for Power Converters [J].
Arikatla, VaraPrasad ;
Abu Qahouq, Jaber A. .
2010 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION, 2010, :223-227
[4]   Reliability-Oriented Design of Three-Phase Power Converters for Aircraft Applications [J].
Burgos, Rolando ;
Chen, Gang ;
Wang, Fred ;
Boroyevich, Dushan ;
Odendaal, Willem Gerhardus ;
van Wyk, Jacobus Daniel .
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 2012, 48 (02) :1249-1263
[5]  
Celaya J., 2012, Annual Conference of the Prognostics and Health Management Society, V3, P1
[6]   Reliability Estimation of Three Single-Phase Topologies in Grid-Connected PV Systems [J].
Chan, Freddy ;
Calleja, Hugo .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2011, 58 (07) :2683-2689
[7]   A digital boost converter to drive white LEDs [J].
Chang, Wei-Hsu ;
Chen, Dan ;
Nien, Hung-Shou ;
Chen, Chih-Hung .
APEC 2008: TWENTY-THIRD ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, VOLS 1-4, 2008, :558-+
[8]   Failure Precursors for Polymer Resettable Fuses [J].
Cheng, Shunfeng ;
Tom, Kwok ;
Pecht, Michael .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2010, 10 (03) :374-380
[9]   Effect of the Mission Profile on the Reliability of a Power Converter Aimed at Photovoltaic Applications-A Case Study [J].
De Leon-Aldaco, Susana Estefany ;
Calleja, Hugo ;
Chan, Freddy ;
Jimenez-Grajales, Humberto R. .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2013, 28 (06) :2998-3007
[10]  
*DEP DEF, 1991, MIL HDB REL PRED EL