Comparison of three focus sensors for optical topography measurement of rough surfaces

被引:8
作者
Sarbort, Martin [1 ]
Hola, Miroslava [1 ]
Pavelka, Jan [1 ]
Schovanek, Petr [2 ,3 ]
Rerucha, Simon [1 ]
Oulehla, Jindrich [1 ]
Fort, Tomas [1 ]
Lazar, Josef [1 ]
机构
[1] Czech Acad Sci, Inst Sci Instruments, Kralovopolska 147, Brno 61264, Czech Republic
[2] Palacky Univ, Dept Opt, 17 Listopadu 1192-12, Olomouc 77146, Czech Republic
[3] Meopta Optika Sro, Kabelikova 1, Prerov 75002, Czech Republic
来源
OPTICS EXPRESS | 2019年 / 27卷 / 23期
关键词
PROFILOMETRY; STYLUS; BEAM;
D O I
10.1364/OE.27.033459
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The study compares three variants of focus sensors designed for the optical topography measurement of rough surface specimens with submicron accuracy. We present a theoretical analysis of the focus sensor principles and the experimental measurements with a single point laser probe. A low coherent illumination beam was provided by a monochromatic laser source and a rotating diffuser, which reduced the speckles generated by the rough surface. The reflected beam was modulated by three specific optical elements (axicon, double wedge prism, four spherical lenses) realized by a spatial light modulator. A digital camera detected the output intensity patterns that were evaluated by the intensity centroid method. The results showed a good coincidence of the surface profiles obtained by the three sensor variants with the root-mean-square deviations below one micron. We discuss the results obtained for several specimens with various surface roughness and compare the differences between the three focus sensor variants. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:33459 / 33473
页数:15
相关论文
共 28 条
  • [1] High quality quasi-Bessel beam generated by round-tip axicon
    Brzobohaty, Oto
    Cizmar, Tomas
    Zemanek, Pavel
    [J]. OPTICS EXPRESS, 2008, 16 (17) : 12688 - 12700
  • [2] In situ wavefront correction and its application to micromanipulation
    Cizmar, Tomas
    Mazilu, Michael
    Dholakia, Kishan
    [J]. NATURE PHOTONICS, 2010, 4 (06) : 388 - 394
  • [3] AUTOMATIC FOCUS CONTROL - THE ASTIGMATIC LENS APPROACH
    COHEN, DK
    GEE, WH
    LUDEKE, M
    LEWKOWICZ, J
    [J]. APPLIED OPTICS, 1984, 23 (04): : 565 - 570
  • [4] Principles of interference microscopy for the measurement of surface topography
    de Groot, Peter
    [J]. ADVANCES IN OPTICS AND PHOTONICS, 2015, 7 (01): : 1 - 65
  • [5] Development of an optical stylus displacement sensor for surface profiling instruments
    Fukatsu, H
    Yanagi, K
    [J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2005, 11 (8-10): : 582 - 589
  • [6] Goodman J. W., 1996, INTRO FOURIER OPTICS
  • [7] Haberland R., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V802, P146, DOI 10.1117/12.967114
  • [8] Häusler G, 2011, OPTICAL MEASUREMENT OF SURFACE TOPOGRAPHY, P23
  • [9] Sensor-Based Auto-Focusing System Using Multi-Scale Feature Extraction and Phase Correlation Matching
    Jang, Jinbeum
    Yoo, Yoonjong
    Kim, Jongheon
    Paik, Joonki
    [J]. SENSORS, 2015, 15 (03) : 5747 - 5762
  • [10] Diffractive optical tweezers in the Fresnel regime
    Jesacher, A
    Fürhapter, S
    Bernet, S
    Ritsch-Marte, M
    [J]. OPTICS EXPRESS, 2004, 12 (10): : 2243 - 2250