Toward Single Atom Chains with Exfoliated Tellurium

被引：56

作者：

Churchill, Hugh O. H. ^{[1
,2
]}

Salamo, Gregory J. ^{[1
,2
]}

Yu, Shui-Qing ^{[2
,3
]}

Hironaka, Takayuki ^{[2
,3
]}

Hu, Xian ^{[1
,2
]}

Stacy, Jeb ^{[1
]}

Shih, Ishiang ^{[4
]}

机构：

[1] Univ Arkansas, Dept Phys, Fayetteville, AR 72701 USA

[2] Univ Arkansas, Inst Nanosci & Engn, Fayetteville, AR 72701 USA

[3] Univ Arkansas, Dept Elect Engn, Fayetteville, AR 72701 USA

[4] McGill Univ, Dept Elect & Comp Engn, Montreal, PQ H3A 0G4, Canada

来源：

NANOSCALE RESEARCH LETTERS | 2017年 / 12卷

关键词：

Atom chain; Tellurium; Exfoliation; 1D layered material; RAMAN-SCATTERING; LATTICE-DYNAMICS; MOLECULAR WIRES; SE; NANOWIRES; SPECTRA; GROWTH; TEO2; WAVE;

D O I：

10.1186/s11671-017-2255-x

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We demonstrate that the atom chain structure of Te allows it to be exfoliated as ultra-thin flakes and nanowires. Atomic force microscopy of exfoliated Te shows that thicknesses of 1-2 nm and widths below 100 nm can be exfoliated with this method. The Raman modes of exfoliated Te match those of bulk Te, with a slight shift (4 cm(-1)) due to a hardening of the A(1) and E modes. Polarized Raman spectroscopy is used to determine the crystal orientation of exfoliated Te flakes. These experiments establish exfoliation as a route to achieve nanoscale trigonal Te while also demonstrating the potential for fabrication of single atom chains of Te.

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