The height dependence of image contrast when imaging by non-contact AFM

被引：3
|
作者：
Sokolov, IY
Henderson, GS
机构：
[1] Univ Toronto, Dept Geol, Toronto, ON M5S 3B1, Canada
[2] Univ Toronto, Dept Phys, Toronto, ON M5S 1A7, Canada
来源：
SURFACE SCIENCE | 2000年 / 464卷 / 2-3期
关键词：
atomic force microscopy; computer simulations; semi-empirical models and model calculations; surface defects; surface structure; morphology; roughness; and topography;
D O I：
10.1016/S0039-6028(00)00735-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Using the pair-wise summation of the Lennard-Jones potential, we have analyzed the height dependence of the image contrast in atomic force microscopy at atomic resolution when scanning in non-contact mode. When we study the images obtained as the surfaces of constant force gradient (fast feedback on frequency shift), we find that images remain qualitatively similar for the range of tip-sample distances analyzed. However, for a slow feedback mode, which is more commonly used because of mechanical instabilities that exist in the fast feedback regime, we have found a spectrum of artefacts that are dependent on the tip-sample distance. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：L745 / L751
页数：7
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