Surface and structural analyses of helium ion irradiated beryllium

被引:11
作者
Dutta, N. J. [1 ,4 ]
Mohanty, S. R. [1 ,2 ]
Sooraj, K. P. [3 ]
Ranjan, M. [2 ,3 ]
机构
[1] Inst Plasma Res, Ctr Plasma Phys, Kamrup 782402, Assam, India
[2] Homi Bhabha Natl Inst, Mumbai 400094, Maharashtra, India
[3] Inst Plasma Res, FCIPT, Gandhinagar 382016, Gujarat, India
[4] BN Coll, Dept Phys, Dhubri 783324, Assam, India
关键词
Plasma focus; Pulsed helium ion; Beryllium; Ostwald ripening; Helium bubbles; PLASMA; EVOLUTION; RADIATION; GAS;
D O I
10.1016/j.vacuum.2019.108962
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present the findings of pulsed helium ion irradiation on beryllium that is emitted from a tabletop pulsed ion source. The source delivers a broad range of helium ion energy having most probable energy of 60 keV with a flux of similar to 10(25)m(-2) s(-1). The FESEM micrographs of irradiated samples depict the formation of helium bubbles having tri-modal size distribution. The appearance of larger size bubbles is supposed to be resulted due to Ostwald ripening phenomenon. The calculated rate of irradiation swelling for the beryllium sample due to the development of helium bubbles is found to similar to 0.24%. The three dimensional AFM micrographs suggest the formation of the hill like structures. An increase in the roughness value of irradiated samples is observed when the helium ion pulse number increases (up to 5 shots) and finally the roughness value decreases for 10 shots helium ion irradiation sample. The XRD patterns reveal the polycrystalline nature of the beryllium samples. In the case of irradiated samples, two feeble planes of beryllium oxide are speculated and most intense peak (002) confirms the formation of compressive stress due to helium ion irradiation.
引用
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页数:10
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