Reliability of Cu nanoparticle joint for high temperature power electronics

被引:31
作者
Ishizaki, T. [1 ]
Kuno, A. [2 ]
Tane, A. [2 ]
Yanase, M. [2 ]
Osawa, F. [2 ]
Satoh, T. [1 ]
Yamada, Y. [2 ]
机构
[1] Toyota Cent Res & Dev Labs Inc, Nagakute, Aichi 4801192, Japan
[2] Daido Univ, Dept Elect & Elect Engn, Nagoya, Aichi 4578530, Japan
关键词
Cu nanoparticle; Sintering; Joint; Power cycle; High-temperature reliability; SOLDER; DEVICES;
D O I
10.1016/j.microrel.2014.07.113
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Power cycle reliability of Cu nanoparticle joint has been studied for high temperature operation of power devices. Al2O3 heater chips and Cu-65 wt% Mo baseplates were joined by Cu nanoparticles and Sn-0.7Cu and power cycle tests of 65/200 degrees C and 65/250 degrees C were carried out on the joints. The Cu nanoparticles were prepared by reducing Cu carbonate in ethylene glycol with dodecanoic acid + dodecyl amine (C12) and decanoic acid and decyl amine (C10) as capping agents. A power cycle test of 65/200 degrees C did not inflict severe damage on the Cu nanoparticle joints so that there were not many cracks formed after 3000 cycles. Vertical cracks were formed in the C12 Cu nanoparticle joint after 3000 cycles of 65/250 degrees C test, however the maximum temperature during the power cycle test did not change at all because vertical cracks did not have an effect on preventing heat flow. On the contrary, lateral cracks were completely formed in the Sn-0.7Cu soldered joint after 200 cycles of 65/200 degrees C test and in the C10 Cu nanoparticle joint after 360 cycles of 65/250 degrees C test. In these experiments, the maximum temperatures were rapidly increased because heat conduction was prevented across the formed lateral cracks. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1867 / 1871
页数:5
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