Using quantum dots to evaluate subsurface damage depths and formation mechanisms in glass

被引:24
作者
Williams, W. [1 ]
Mullany, B. [1 ]
Parker, W. [2 ]
Moyer, P. [2 ]
Randles, M. [3 ]
机构
[1] UNC Charlotte, Dept Mech Engn & Engn Sci, Charlotte, NC 28223 USA
[2] UNC Charlotte, Dept Phys & Opt Sci, Charlotte, NC USA
[3] Northrop Grumman Synopt, Charlotte, NC USA
基金
美国国家科学基金会;
关键词
Polishing; Surface integrity; Subsurface damage; PHOTOTHERMAL MICROSCOPE; SURFACE-ROUGHNESS; PARTICLE REMOVAL; ELECTROLUMINESCENCE; SCATTERING;
D O I
10.1016/j.cirp.2010.03.137
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Subsurface damage (SSD) is a layer of fractured and stressed material that remains beneath an apparently well polished surface. It is detrimental to the quality and performance of high end optical components and laser crystals. While many methods exist to detect SSD none offer insights into damage formation mechanisms and few estimate damage depths. The technique of tagging lapping and polishing slurries with quantum dots (nano-sized fluorescent crystals) does both. Fluorescence was detected at depths up to 10 mu m beneath the surface of glass slides processed with tagged slurries. The dots are introduced to the subsurface through brittle fracture mechanisms. (C) 2010 CIRP.
引用
收藏
页码:569 / 572
页数:4
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