System-level design hardening based on worst-case ASET simulations

被引：24
作者：
Boulghassoul, Y [1 ]
Adell, PC [1 ]
Rowe, JD [1 ]
Massengill, LW [1 ]
Schrimpf, RD [1 ]
Sternberg, AL [1 ]
机构：
[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2004年 / 51卷 / 05期
关键词：
analog single-event transients (ASETs); ASET propagation; LM124 and OP27 operational amplifiers; system-level hardening by design;
D O I：
10.1109/TNS.2004.835091
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present experimental and simulation results on single-event transients in an analog subsystem for satellite electronic equipment. Investigations based on worst-case transient events, simulated with transistor-level circuit models, suggest design modifications for hardening.
引用
收藏
页码：2787 / 2793
页数：7
相关论文
共 8 条
  • [1] Analysis of single-event transients in analog circuits
    Adell, P
    Schrimpf, RD
    Barnaby, HJ
    Marec, R
    Chatry, C
    Calvel, P
    Barillot, C
    Mion, O
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2000, 47 (06) : 2616 - 2623
  • [2] Circuit Modeling of the LM124 operational amplifier for analog single-event transient analysis
    Boulghassoul, Y
    Massengill, LW
    Sternberg, AL
    Pease, RL
    Buchner, S
    Howard, JW
    McMorrow, D
    Savage, MW
    Poivey, C
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 3090 - 3096
  • [3] An empirical model for predicting proton induced upset
    Calvel, P
    Barillot, C
    Lamothe, P
    Ecoffet, R
    Duzellier, S
    Falguere, D
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (06) : 2827 - 2832
  • [4] Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
    Koga, R
    Penzin, SH
    Crawford, KB
    Crain, WR
    Moss, SC
    Pinkerton, SD
    LaLumondiere, SD
    Maher, MC
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 2325 - 2332
  • [5] Marec R., 2001, P 6 EUR C RAD ITS EF, P343
  • [6] ROWE JD, 2003, P 7 EUR C RAD ITS EF
  • [7] The role of parasitic elements in the single-event transient response of linear circuits
    Sternberg, AL
    Massengill, LW
    Buchner, S
    Pease, RL
    Boulghassoul, Y
    Savage, MW
    McMorrow, D
    Weller, RA
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 3115 - 3120
  • [8] Effect of amplifier parameters on single-event transients in an inverting operational amplifier
    Sternberg, AL
    Massengill, LW
    Schrimpf, RD
    Boulghassoul, Y
    Barnaby, HJ
    Buchner, S
    Pease, RL
    Howard, JW
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (03) : 1496 - 1501
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