An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy

被引：12

作者：

Dester, Gary D. ^{[1
]}

Rothwell, Edward J. ^{[1
]}

Havrilla, Michael J. ^{[2
]}

机构：

[1] Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA

[2] USAF, Inst Technol, Dept Elect & Comp Engn, Wright Patterson AFB, OH 45433 USA

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2010年 / 20卷 / 05期

关键词：

Error analysis; materials testing; microwave measurements; mode matching methods; waveguide junctions; REFLECTION;

D O I：

10.1109/LMWC.2010.2045600

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Waveguide probes are useful for extracting the electric and magnetic properties of material layers, but the accuracy of the results is limited by the accuracy of the theoretical model. Using more modes in the expansion of the waveguide fields produces better results, but the computational cost increases with the number of modes squared. This letter analyzes the dependence of solution accuracy on the number of modes used and, based on this, introduces an extrapolation technique that allows the number of modes to be significantly reduced with little loss of accuracy.

引用

页码：298 / 300

页数：3

共 12 条

[1] Disbond thickness evaluation employing multiple-frequency near-field microwave measurements [J].

Abou-Khousa, Mohamed ;

Zoughi, R. .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2007, 56 (04) :1107-1113

[2] OPEN-ENDED RECTANGULAR WAVE-GUIDE FOR NONDESTRUCTIVE THICKNESS MEASUREMENT AND VARIATION DETECTION OF LOSSY DIELECTRIC SLABS BACKED BY A CONDUCTING PLATE [J].

BAKHTIARI, S ;

GANCHEV, SI ;

ZOUGHI, R .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1993, 42 (01) :19-24

[3] Multimode solution for the reflection properties of an open-ended rectangular waveguide radiating into a dielectric half-space: The forward and inverse problems [J].

Bois, KJ ;

Benally, AD ;

Zoughi, R .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (06) :1131-1140

[4] Nondestructive determination of electromagnetic parameters of dielectric materials at X-band frequencies using a waveguide probe system [J].

Chang, CW ;

Chen, KM ;

Qian, J .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (05) :1084-1092

[5]

Dester G. D., 2008, THESIS MICHIGAN STAT

[6]

Gray S, 1997, MATER EVAL, V55, P42

[7] PERMITTIVITY DETERMINATION OF FRESH CEMENT-BASED MATERIALS BY AN OPEN-ENDED WAVEGUIDE PROBE USING AMPLITUDE-ONLY MEASUREMENTS [J].

Hasar, U. C. .

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2009, 97 :27-43

[8] A nondestructive technique for determining complex permittivity and permeability of magnetic sheet materials using two flanged rectangular waveguides [J].

Hyde, M. W. ;

Havrilla, M. J. .

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2008, 79 :367-386

[9] Nondestructive electromagnetic material characterization using a dual waveguide probe: A full wave solution [J].

Hyde, Milo W. ;

Stewart, James W. ;

Havrilla, Michael J. ;

Baker, William P. ;

Rothwell, Edward J. ;

Nyquist, Dennis P. .

RADIO SCIENCE, 2009, 44

[10]

Maode N., 1999, IEEE Trans. Instrum. Meas, V47, P476

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