Tensile fracture behavior of Sn-3.0Ag-0.5Cu solder joints on copper

被引:0
作者
Ju, Guo-kui [1 ,2 ]
Wei, Xi-cheng [1 ,2 ]
Peng, Sun [1 ,3 ]
Liu, Johan [1 ,3 ]
机构
[1] Shanghai Univ, Key Lab Adv Displays & Syst Applicat, Minist Educ, Shanghai 200072, Peoples R China
[2] Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
[3] Chalmers Univ Technol, SMIT Ctr, S-41296 Gothenburg, Sweden
来源
HDP'07: PROCEEDINGS OF THE 2007 INTERNATIONAL SYMPOSIUM ON HIGH DENSITY PACKAGING AND MICROSYSTEM INTEGRATION | 2007年
关键词
IMC; Cu/Sn-3.0Ag-0.5Cu/Cu joint; tensile fracture; Kirkendall void;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Microstructural features and tensile properties of Sn-3.0Ag-0.5Cu solder joints on copper with various aging time at 150 degrees C were examined. The solder inner and solder/Cu interface were analyzed by SEM to identify the fracture location, morphology and compositions. The study has showed, the tensile fracture strength of the solder joints decreases with the increased aging time, and the crack initiates mostly at the interfaces between the solder and IMC layer or/and IMC and IMC layer. The morphology of fracture surface changes from dimple-like to cleavage-like surfaces. The needle-like or block-like interfacial IMCs form at the interface of Cu/solder and grow into the solder matrix. Otherwise, the Kirkendall voids can be observed in the multilayer structure close to the copper substrate. These voids have probably a detrimental effect on the tensile fracture behavior.
引用
收藏
页码:306 / +
页数:3
相关论文
共 21 条
  • [1] Lead-free solders in microelectronics
    Abtew, M
    Selvaduray, G
    [J]. MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) : 95 - 141
  • [2] CHANG JL, 2005, J FUNCTIONAL MAT DEV, V11, P446
  • [3] DUAN N, 2003, MICROELECTRON RELIAB, V8, P13
  • [4] Analysis of ring and plug shear strengths for comparison of lead-free solders
    Foley, JC
    Gickler, A
    Leprevost, FH
    Brown, D
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (10) : 1258 - 1263
  • [5] HENDERSON DW, 2005, RC23558 IBM
  • [6] Houghton FDB, 2000, CIRCUIT WORLD, V26, P10, DOI 10.1108/03056120010310882
  • [7] Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder
    Islam, MN
    Chan, YC
    Rizvi, MJ
    Jillek, W
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 400 (1-2) : 136 - 144
  • [8] Ag3Sn plate formation in the solidification of near-ternary eutectic Sn-Ag-Cu
    Kang, SK
    Choi, WK
    Shih, DY
    Henderson, DW
    Gosselin, T
    Sarkhel, A
    Goldsmith, C
    Puttlitz, KJ
    [J]. JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2003, 55 (06): : 61 - 65
  • [9] The formation and growth of intermetallic compounds and shear strength at Sn-Zn solder/Au-Ni-Cu interfaces
    Kim, KS
    Ryu, KW
    Yu, CH
    Kim, JM
    [J]. MICROELECTRONICS RELIABILITY, 2005, 45 (3-4) : 647 - 655
  • [10] Influence of interfacial intermetallic compound on fracture behavior of solder joints
    Lee, HT
    Chen, MH
    Jao, HM
    Liao, TL
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 358 (1-2): : 134 - 141