Design and Characterization of Newly Developed 10 kV 2 A SiC p-i-n Diode for Soft-Switching Industrial Power Supply

被引:15
作者
Bakowski, Mietek [1 ]
Ranstad, Per [2 ]
Lim, Jang-Kwon [1 ]
Kaplan, Wlodek [1 ]
Reshanov, Sergey A. [1 ]
Schoner, Adolf [1 ]
Giezendanner, Florian [2 ]
Ranstad, Anton [2 ]
机构
[1] Acreo Swedish ICT AB, S-16440 Kista, Sweden
[2] Alstom Power Sweden AB, S-35112 Vaxjo, Sweden
关键词
4H-SiC; avalanche energy; bipolar degradation; carrier lifetime; dynamic ON-resistance; Junction Termination Extension (JTE); p-i-n diode; soft switching; SIMULATION;
D O I
10.1109/TED.2014.2361165
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
10 kV, 2 A SiC p-i-n diodes have been designed and fabricated. The devices feature excellent stability of forward characteristics and robust junction termination with avalanche capability of 1 J. The fabricated diodes have been electrically evaluated with respect to dynamic ON-state voltage, reverse recovery behavior, bipolar stability, and avalanche capability. More than 60% reduction of losses has been demonstrated using newly developed 10-kV p-i-n diodes in a multikilowatt high voltage, high-frequency dc/dc soft-switching converter.
引用
收藏
页码:366 / 373
页数:8
相关论文
共 19 条
[1]   Merits of Buried Grid Technology for Advanced SiC Device Concepts [J].
Bakowski, M. ;
Lim, J-K. ;
Kaplan, W. ;
Schoener, A. .
GALLIUM NITRIDE AND SILICON CARBIDE POWER TECHNOLOGIES, 2011, 41 (08) :155-162
[2]  
Bakowski M, 1997, PHYS STATUS SOLIDI A, V162, P421, DOI 10.1002/1521-396X(199707)162:1<421::AID-PSSA421>3.0.CO
[3]  
2-B
[4]  
Bakowski M., 2006, Transactions of the Institute of Electrical Engineers of Japan, Part D, V126D, P391, DOI 10.1541/ieejias.126.391
[5]   Walk-out phenomena in 6H-SiC mesa diodes with SiO2/Si3N4 passivation and charge trapping in dry and wet oxides on N-type 6H-SiC [J].
Bakowski, M ;
Gustafsson, U ;
Ovuka, Z .
MICROELECTRONICS AND RELIABILITY, 1998, 38 (03) :381-392
[6]  
Bakowski M., 1999, U.S. Patent, Patent No. [5 932 894, 5932894]
[7]  
Bakowski M., 2000, U.S. Patent, Patent No. [6 040 237, 6040237]
[8]   Theoretical investigation of planar junction termination [J].
Drabe, T ;
Sittig, R .
SOLID-STATE ELECTRONICS, 1996, 39 (03) :323-328
[9]   Space-Modulated Junction Termination Extension for Ultrahigh-Voltage p-i-n Diodes in 4H-SiC [J].
Feng, Gan ;
Suda, Jun ;
Kimoto, Tsunenobu .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 59 (02) :414-418
[10]   Simulation and experimental study on the junction termination structure for high-voltage 4H-SiC PiN diodes [J].
Hiyoshi, Toru ;
Hori, Tsutomu ;
Suda, Jun ;
Kimoto, Tsunenobu .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (08) :1841-1846