Measuring the Extinction Index of Dielectric Films Using Frustrated Total Internal Reflectance Spectroscopy

被引：1

作者：

Nguyen, V. B. ^{[1
]}

Gubanova, L. A. ^{[1
]}

机构：

[1] St Petersburg State Univ Informat Technol Mech &, St Petersburg 197101, Russia

来源：

TECHNICAL PHYSICS LETTERS | 2018年 / 44卷 / 08期

关键词：

THIN-FILMS;

D O I：

10.1134/S1063785018080278

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Various methods of measuring the coefficient of light attenuation in optical coatings are considered. It is shown that the dimensionless extinction index of a coating made of a weakly absorbing film-forming material can be measured using a special attachment based on a parallelepiped-shaped optical prism. Parameters of the proposed attachment are calculated so that it could be arranged inside standard spectrophotometers.

引用

页码：746 / 748

页数：3

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