Characterization of a hybrid PVD/PACVD system for the deposition of TiC/CaO nanocomposite films by OES and probe measurements

被引:13
作者
Kulisch, W [1 ]
Colpo, P
Rossi, F
Shtansky, DV
Levashov, EA
机构
[1] Univ Gesamthsch Kassel, Dept Nat Sci, D-34109 Kassel, Germany
[2] Joint Res Ctr, Inst Hlth & Consumer Protect, Ispra, Italy
[3] Moscow State Inst Steel & Alloys, Moscow, Russia
关键词
hybrid PVD/PACVD system; TiC/CaO nanocomposite films; optical emission spectroscopy;
D O I
10.1016/j.surfcoat.2004.07.006
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A hybrid PVD/PACVD system, which was used for the deposition of TiC/CaO nanocomposite films from a TiC0.5 + 10% CaO target, has been characterized by optical emission spectroscopy (OES), electrical probe measurements and deposition experiments. The system consists of a dc magnetron unit to create a flux of species to be deposited, an inductively coupled rf Ar plasma by which these species are excited and ionized to a high degree and a rf substrate bias plasma by means of which the energy of the ions impinging onto the growing film is determined. Optical inspection shows that the plasma is spatially bisected, with a typical argon plasma in the vicinity of the substrate holder, while the vicinity of the target is dominated by excited and ionized species from the target. The spatial extent of both regions depends on the interplay of the deposition parameters, especially the target current (power) and the inductively coupled plasma (ICP) power. The two different plasma states, which are obviously different with respect to both, plasma density and electron temperature, also reflect in the optical emission spectra taken in the vicinity of the target, the currents measured by an electrical probe at the position of the substrate holder, and even the deposition rates obtained with this system. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:714 / 720
页数:7
相关论文
共 17 条
  • [1] Collisional-radiative model for an argon glow discharge
    Bogaerts, A
    Gijbels, R
    Vlcek, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 84 (01) : 121 - 136
  • [2] Modeling of glow discharge optical emission spectrometry: Calculation of the argon atomic optical emission spectrum
    Bogaerts, A
    Gijbels, R
    Vlcek, J
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1998, 53 (11) : 1517 - 1526
  • [3] OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY
    COBURN, JW
    CHEN, M
    [J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (06) : 3134 - 3136
  • [4] W and WC layers deposition by shielded inductively coupled plasma source
    Colpo, P
    Meziani, T
    Sauvageot, P
    Ceccone, G
    Gibson, PN
    Rossi, F
    Monge-Cadet, P
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2002, 20 (05): : 1632 - 1638
  • [5] Radial uniformity of an external-coil ionized physical vapor deposition source
    Dickson, M
    Zhong, G
    Hopwood, J
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (02): : 523 - 531
  • [6] Influence of laser energy density on the plasma expansion dynamics and film stoichiometry during laser ablation of BiSrCaCuO
    Gonzalo, J
    Afonso, CN
    Perriere, J
    [J]. JOURNAL OF APPLIED PHYSICS, 1996, 79 (10) : 8042 - 8046
  • [7] PLASMA EXPANSION DYNAMICS IN REACTIVE AND INERT ATMOSPHERES DURING LASER-ABLATION OF BI(2)SR(2)CA(1)CU(2)O(7-Y)
    GONZALO, J
    VEGA, F
    AFONSO, CN
    [J]. JOURNAL OF APPLIED PHYSICS, 1995, 77 (12) : 6588 - 6593
  • [8] COPPER DEPOSITION BY ELECTRON-CYCLOTRON-RESONANCE PLASMA
    HOLBER, WM
    LOGAN, JS
    GRABARZ, HJ
    YEH, JTC
    CAUGHMAN, JBO
    SUGERMAN, A
    TURENE, FE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (06): : 2903 - 2910
  • [9] MECHANISMS FOR HIGHLY IONIZED MAGNETRON SPUTTERING
    HOPWOOD, J
    QIAN, F
    [J]. JOURNAL OF APPLIED PHYSICS, 1995, 78 (02) : 758 - 765
  • [10] ICP assisted sputter deposition of TiC/CaO nanocomposite films
    Kulisch, W
    Colpo, P
    Gibson, PN
    Ceccone, G
    Shtansky, DV
    Levashov, EA
    Rossi, F
    [J]. SURFACE & COATINGS TECHNOLOGY, 2004, 188 : 735 - 740