共 48 条
[41]
Development of Wafer Level Underfill Materials and Assembly Processes for Fine Pitch Pb-free Solder Flip Chip Packaging
[J].
2011 IEEE 61ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC),
2011,
:1015-1022
[43]
A Study on Nano-sized Silica Contents and Size Effect in Non-Conductive Films (NCFs) for Ultra Fine-pitch Cu-pillar/Sn-Ag Micro-Bump Interconnection
[J].
2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017),
2017,
:399-404
[44]
Effect of Material Properties of Double-Layer Non Conductive Films (D-NCFs) On the Reflow Reliability of Ultra Fine-pitch Cu-pillar/Sn-Ag Micro Bump Interconnection
[J].
2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017),
2017,
:2110-2115
[45]
Modeling, Design, Fabrication and Demonstration of RF Front-End 3D IPAC Module with Ultra-thin Glass Substrates for LTE Applications
[J].
2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC),
2016,
:1297-1302
[46]
Antiphase boundary-free III-V materials epitaxially grown on on-axis silicon (001) substrates by ultra-thin silicon buffer
[J].
APL MATERIALS,
2025, 13 (04)
[47]
Demonstration of 20μm Pitch Micro-vias by Excimer Laser Ablation in Ultra-thin Dry-film Polymer Dielectrics for Multi-layer RDL on Glass Interposers
[J].
2015 IEEE 65TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC),
2015,
:922-927
[48]
First Demonstration of Copper-plated Through-Package-Via (TPV) Reliability in Ultra-thin 3D Glass Interposers with Double-side Component Assembly
[J].
2015 IEEE 65TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC),
2015,
:666-671