CDF run IIb silicon vertex detector DAQ upgrade

被引：1

作者：

Behari, S ^{[1
]}

Bacchetta, N

Bolla, G

Cardoso, G

Ciobanu, CI

Flaugher, B

Garcia-Sciveres, M

Haber, C

Hara, K

Harr, R

Hsiung, TH

Junk, T

Kim, S

Lu, RS

Lujan, P

Maksimovic, P

Merkel, P

Nord, B

Pavlicek, V

Pellett, D

Pursley, J

Schuyler, B

Shenai, A

Treptow, K

Weber, M

Zimmermann, S

机构：

[1] Johns Hopkins Univ, Baltimore, MD 21218 USA

[2] Univ Padua, Padua, Italy

[3] Ist Nazl Fis Nucl, Padua, Italy

[4] Purdue Univ, W Lafayette, IN 47907 USA

[5] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA

[6] Univ Illinois, Urbana, IL 61801 USA

[7] Lawrence Berkeley Lab, Berkeley, CA 94720 USA

[8] Univ Tsukuba, Tsukuba, Ibaraki 3058571, Japan

[9] Wayne State Univ, Detroit, MI 48202 USA

[10] Acad Sinica, Taipei 11529, Taiwan

[11] Univ Calif Davis, Davis, CA 95616 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2004年 / 51卷 / 06期

关键词：

Collider Detector at Fermilab (CDF) run IIb; data acquisition; PCI; silicon strip detector; VME;

D O I：

10.1109/TNS.2004.839065

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Collider Detector at Fermilab (CDF) [1] operates in the beamline of the Tevatron proton-antiproton collider at Batavia, IL. The Tevatron is expected to undergo luminosity upgrades (Run IIb) in the future, resulting in a higher number of interactions per beam crossing. To operate in this dense radiation environment, an upgrade of the CDF's silicon vertex detector subsystem and a corresponding upgrade of its VME-based DAQ system has been explored. Prototypes of all the Run IIb SVX DAQ components have been constructed, assembled into a test stand, and operated successfully using an adapted version of the CDF's network-capable DAQ software. In addition, a PCI-based DAQ system has been developed as a fast and inexpensive tool for silicon detector and DAQ component testing in the production phase. In this paper, we present an overview of the Run IIb silicon DAQ upgrade, emphasizing the new features and improvements incorporated into the constituent VME boards and discuss a PCI-based DAQ system developed to facilitate production tests.

引用

页码：3047 / 3054

页数：8

共 21 条

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