Structure and Tensile Force of Nanometer- and Atomic-Sized Gold Contacts during Conductance Feedback Control

被引:1
作者
Matsuda, Tomoko [1 ]
Kizuka, Tokushi [1 ]
机构
[1] Univ Tsukuba, Inst Mat Sci, Tsukuba, Ibaraki 3058573, Japan
关键词
TRANSMISSION ELECTRON-MICROSCOPY; QUANTUM POINT CONTACTS; CURRENT-VOLTAGE CURVES; METALLIC CONTACTS; QUANTIZATION; TRANSPORT; SIGNATURE; DYNAMICS; BIAS;
D O I
10.1143/JJAP.48.125007
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanometer- and atomic-sized gold (Au) contacts were produced by the retraction of a Au nanotip from contact with a Au plate at room temperature inside a transmission electron microscope. The nanotip-plate distance was controlled using a conductance feedback system. Au contacts showing certain conductance were observed continuously by in situ lattice imaging with simultaneous force measurements. When feedback conductance was selected to be 1G(0) (where G(0) = 2e(2)/h, where e is the charge of an electron and h Planck's constant), three types of Au contacts, i.e., zero-length contacts of one-, two-, and three-atom width, were observed under a stress of similar to 8 GPa with a counting ratio of 54, 36, and 10%, respectively. Similarly, for feedback conductance of 2G(0), 3G(0), 4G(0), and 5G(0), Au contacts of one- to five-atom width were observed, Thus, it was demonstrated that a certain conductance corresponding to a quantized level is caused by several types of contacts. (C) 2009 The Japan Society of Applied Physics
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页数:4
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