Absolute calibration of vacuum ultraviolet spectrograph system for plasma diagnostics

A space- and time-resolving vacuum ultraviolet (VUV) spectrograph system has been applied to diagnose impurity ions behavior in plasmas produced in the tandem mirror GAMMA 10 and the reversed field pinch TPE-RX. We have carried out ray tracing calculations for obtaining the characteristics of the VUV spectrograph and calibration experiments to measure the absolute sensitivities of the VUV spectrograph system for the wavelength range from 100 to 1100 Angstrom. By changing the incident angle, 50.6degrees-51.4degrees, to the spectrograph whose nominal incident angle is 51degrees, we can change the observing spectral range of the VUV spectrograph. In this article, we show the ray tracing calculation results and absolute sensitivities when the angle of incidence into the VUV spectrograph is changed, and the results of VUV spectroscopic measurement in both GAMMA 10 and TPE-RX plasmas. (C) 2004 American Institute of Physics.