Beam control in multiphoton microscopy using a MEMS spatial light modulator

被引：0
作者：
Bifano, Thomas [1 ]
Paudel, Hari [1 ]
机构：
[1] Boston Univ, Photon Ctr, Boston, MA 02215 USA
来源：
MICRO- AND NANOTECHNOLOGY SENSORS, SYSTEMS, AND APPLICATIONS VI | 2014年 / 9083卷
关键词：
MEMS; adaptive optics; superpenetration; spatial light modulation; two-photon microscopy; FOCUSING LIGHT; SCATTERING;
D O I：
10.1117/12.2048981
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We demonstrate feasibility of a an spatially-modulated multi-photon microscopy (S-MPM) technique that can image through complex media that strongly scatters light, and we describe performance achieved with a prototype instrument. S-MPM's imaging advantages are enabled by a high-speed, microelectromechanical spatial light modulator (MEMS SLM) subsystem with 1020 independently controllable mirror segments.
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页数：5
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