Layer-by-layer growth of ε-Ga2O3 thin film by metal-organic chemical vapor deposition

被引:48
作者
Chen, Zimin [1 ]
Li, Zeqi [1 ]
Zhuo, Yi [1 ]
Chen, Weiqu [1 ]
Ma, Xuejin [1 ]
Pei, Yanli [1 ]
Wang, Gang [1 ,2 ]
机构
[1] Sun Yat Sen Univ, HEMC, State Key Lab Optoelect Mat & Technol, Guangzhou 510006, Guangdong, Peoples R China
[2] Sun Yat Sen Univ, Foshan Inst, Foshan 528225, Peoples R China
关键词
PHASE EPITAXY; GALLIUM OXIDE; GAN; INDIUM;
D O I
10.7567/APEX.11.101101
中图分类号
O59 [应用物理学];
学科分类号
摘要
Layer-by-layer morphology is a crucial signature of the quality of epitaxial thin films. In this study, layer-by-layer growth of an epsilon-phase gallium oxide (epsilon-Ga2O3) thin film is demonstrated using metal-organic chemical vapor deposition. A two-step growth method, in which a nucleation layer is grown at 600 degrees C and an epilayer is grown at 640 degrees C, is employed to fabricate a high-quality epsilon-Ga2O3 thin film on a c-plane sapphire substrate. The morphology of the epsilon-Ga2O3 film is evaluated by atomic force microscope. The density of screw-type threading dislocations determined by an X-ray diffraction rocking curve is as low as 1.8 x 10(8)cm(-2). (C) 2018 The Japan Society of Applied Physics
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页数:4
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