Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method

被引：25

作者：

Fang, Y. ^{[1
]}

Jayasuriya, D. ^{[1
]}

Furniss, D. ^{[1
]}

Tang, Z. Q. ^{[1
]}

Sojka, L. ^{[1
,2
]}

Markos, C. ^{[1
,3
]}

Sujecki, S. ^{[1
,2
]}

Seddon, A. B. ^{[1
]}

Benson, T. M. ^{[1
]}

机构：

[1] Univ Nottingham, Midinfrared Photon Grp, George Green Inst Electromagnet Res, Fac Engn, Univ Pk, Nottingham NG7 2RD, England

[2] Wroclaw Univ Technol, Inst Telecommun Teleinformat & Acoust, Wybrzeze Wyspianskiego 27, PL-50370 Wroclaw, Poland

[3] Tech Univ Denmark, Dept Photon Engn, DTU Fotonik, Orsteds Plads 343, DK-2800 Lyngby, Denmark

来源：

OPTICAL AND QUANTUM ELECTRONICS | 2017年 / 49卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

Chalcogenide glasses; Refractive index; Dispersion; OPTICAL-PROPERTIES; GLASSES; FIBER; FABRICATION; CONSTANTS;

D O I：

10.1007/s11082-017-1057-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared spectral region (our measurements are over the wavelength range from 2 to 25 mu m), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (at.%) and Ge16As24Se15.5Te44.5 (at.%) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4% at a wavelength of 3.1 mu m by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.

引用

页数：19

共 32 条

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