Using near-field scanning to predict radiated fields

被引：0

作者：

Shi, J ^{[1
]}

Cracraft, MA ^{[1
]}

Zhang, JM ^{[1
]}

DuBroff, RE ^{[1
]}

Slattery, K ^{[1
]}

Yamaguchi, M ^{[1
]}

机构：

[1] Univ Missouri, Dept Elect & Comp Engn, Electromagnet Compatibil Lab, Rolla, MO 65409 USA

来源：

2004 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD 1-3 | 2004年

关键词：

near-field; EMI; equivalent current;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Near-field scanning has often been used to measure and characterize magnetic fields surrounding individual integrated circuits (IC) and high speed digital electronic circuits. The objective of the work described herein is to use near-field scanning data, performed in a typical laboratory bench top environment, to predict radiated electromagnetic interference (EMI) in a typical product environment. The product environment may include enclosures and apertures.

引用

页码：14 / 18

页数：5

共 10 条

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