A maximum-likelihood analysis framework for terahertz time-domain spectroscopy

被引：2

作者：

Dodge, J. Steven ^{[1
,2
]}

Mohtashemi, Laleh ^{[1
]}

Westlund, Paul ^{[1
]}

Mousavi, Payam ^{[1
]}

Sahota, Derek G. ^{[1
]}

机构：

[1] Simon Fraser Univ, Dept Phys, Burnaby, BC, Canada

[2] Canadian Inst Adv Res, Toronto, ON, Canada

来源：

2020 45TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2020年

关键词：

D O I：

10.1109/IRMMW-THZ46771.2020.9370628

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present a maximum-likelihood framework for analyzing terahertz time-domain spectroscopy measurements. This approach has several advantages other commonly-used methods, especially for evaluating goodness of fit. We also demonstrate a simple time-domain noise model that accurately describes the noise amplitude in a set of repeated measurements. These techniques are broadly applicable to material parameter estimation.

引用

页数：1

共 3 条

[1] Material parameter estimation with terahertz time-domain spectroscopy
Dorney, TD
Baraniuk, RG
Mittleman, DM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2001, 18 (07) : 1562 - 1571
[2] Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy
Duvillaret, L
Garet, F
Coutaz, JL
[J]. APPLIED OPTICS, 1999, 38 (02) : 409 - 415
[3] Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements
Naftaly, Mira
Clarke, Roland G.
Humphreys, David A.
Ridler, Nick M.
[J]. PROCEEDINGS OF THE IEEE, 2017, 105 (06) : 1151 - 1165

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