Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a Faraday Cup operating in the secondary electron emission mode

被引：65

作者：

Kelly, H

Lepone, A

Marquez, A

Sadowski, MJ

Baranowski, J

Skladnik-Sadowska, E

机构：

[1] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, Inst Fis Plasma, RA-1428 Buenos Aires, DF, Argentina

[2] Soltan Inst Nucl Studies, SINS, PL-05400 Otwock, Poland

来源：

IEEE TRANSACTIONS ON PLASMA SCIENCE | 1998年 / 26卷 / 01期

关键词：

Faraday cup diagnostic; ion beams; ion energy spectral analysis; plasma focus;

D O I：

10.1109/27.659540

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N-2 pressure is reported, A Faraday Cup operating in the secondary electron emission mode was employed, To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of approximate to 50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work.

引用

页码：113 / 117

页数：5

共 22 条

[1]

BARANOWSKI J, 1997, P INT S PLASMA 97 RE, V1, P433

[2] MODEL OF SECONDARY-ELECTRON YIELDS FROM ATOMIC AND POLYATOMIC ION IMPACTS ON COPPER AND TUNGSTEN SURFACES BASED UPON STOPPING-POWER CALCULATIONS [J].