A highly reliable radiation tolerant 13T SRAM cell for deep space applications

被引:6
|
作者
Yekula, Ravi Teja [1 ]
Pandey, Monalisa [1 ]
Islam, Aminul [1 ]
机构
[1] Dept ECE, BIT, Ranchi, Jharkhand, India
关键词
SET; SEU; MBU; Critical charge; RSNM; SINGLE EVENT TRANSIENTS; NODE UPSET RECOVERY; READ-DECOUPLED SRAM; LOW-POWER; SOFT ERRORS; DESIGN; VOLTAGE; CHARGE;
D O I
10.1016/j.microrel.2022.114527
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a highly reliable radiation-tolerant 13T (HRRT 13T) SRAM cell for deep-space applications. The proposed SRAM cell design can effectively tolerate radiation events. The design metrics of the proposed SRAM cell are compared with conventionally used SRAM cells like QUCCE 10T, QUCCE 12T and standard 6T SRAM cells. The proposed SRAM cell consumes 9.4% and 14% lesser hold power (HPWR) compared to QUCCE 10T and QUCCE 12T SRAM cells, respectively. The proposed SRAM cell exhibits 12.7%, 3.63% and 11.7% shorter read access time (T-RA) compared to QUCCE 10T, QUCCE 12T and 6T SRAM cells, respectively at a nominal supply voltage (V-DD) of 0.7 V. The proposed HRRT 13T SRAM cell exhibits higher read stability compared to other conventionally used SRAM cells. This has been validated by 2.92x, 2.33x and 2.06x higher read static noise margin (RSNM) exhibited by the proposed cell compared to the 6T, QUCCE 10T and QUCCE 12T SRAM cells, respectively at V-DD = 0.7 V. The proposed SRAM cell exhibits high radiation tolerance capability compared to the conventionally used SRAM cells. This has been proved by 94.1%, 17.8% and 10.0% higher critical charge (Q(C)) of the proposed cell compared to 6T, QUCCE 10T and QUCCE 12T SRAM cells, respectively at V-DD = 0.7 V. The proposed cell achieves all these improvements at the expense of 1.05x, 1.38x and 1.36x longer write delay (T-WA) compared to QUCCE 10T, QUCCE 12T and 6T SRAM cells, respectively at VDD = 0.7 V. Extensive simulations on SPICE using 16-nm CMOS technology are performed to validate the theoretical design of the proposed SRAM cell.
引用
收藏
页数:14
相关论文
共 50 条
  • [11] Variation Tolerant Differential 8T SRAM Cell for Ultralow Power Applications
    Pal, Soumitra
    Islam, Aminul
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2016, 35 (04) : 549 - 558
  • [12] Design of highly reliable energy-efficient SEU tolerant 10T SRAM cell
    Kumar, C. I.
    Anand, B.
    ELECTRONICS LETTERS, 2018, 54 (25) : 1423 - 1424
  • [13] A robust radiation resistant SRAM cell for space and military applications
    Kumar, Mukku Pavan
    Lorenzo, Rohit
    INTEGRATION-THE VLSI JOURNAL, 2024, 96
  • [14] A 13T Radiation-Hardened Memory Cell for Low-Voltage Operation and Ultra-low Power Space Applications
    Qi, Chunhua
    Xiao, Liyi
    Huo, Mingxue
    Wang, Tianqi
    Zhang, Rongsheng
    Cao, Xuebing
    PROCEEDINGS OF THE EIGHTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2017, : 161 - 165
  • [15] A Highly Reliable and Energy Efficient Radiation Hardened 12T SRAM Cell Design
    Kumar, Chaudhry Indra
    Anand, Bulusu
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2020, 20 (01) : 58 - 66
  • [16] Nwise and Pwise: 10T Radiation Hardened SRAM Cells for Space Applications With High Reliability Requirements
    Seyedi, Azam
    Aunet, Snorre
    Kjeldsberg, Per Gunnar
    IEEE ACCESS, 2022, 10 : 30624 - 30642
  • [17] Radiation hardened 11T memory cell for space applications
    Epiphany, Jebamalar Leavline
    Arumugam, Sugantha
    MICROPROCESSORS AND MICROSYSTEMS, 2023, 102
  • [18] Design and analysis of radiation hardened 10 T SRAM cell for space and terrestrial applications
    Mukku, Pavan Kumar
    Lorenzo, Rohit
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2023, 29 (10): : 1489 - 1500
  • [19] A highly stable reliable SRAM cell design for low power applications
    Pal, Soumitra
    Bose, Subhankar
    Ki, Wing-Hung
    Islam, Aminul
    MICROELECTRONICS RELIABILITY, 2020, 105
  • [20] A 14T radiation hardened SRAM for space applications with high reliability
    Bai, Na
    Qin, Zhangyi
    Li, Li
    Xu, Yaohua
    Wang, Yi
    INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2024, 52 (06) : 2956 - 2970