Polyaniline;
PANI;
CuO composites;
Electromagnetic interference;
Transmission;
Electron microscopy;
Anticorrosive composite;
AC conductivity;
M HCL SOLUTION;
MILD-STEEL;
DIELECTRIC-PROPERTIES;
CORROSION INHIBITION;
ASSISTED SYNTHESIS;
FACILE APPROACH;
ACID;
NANOPARTICLES;
GREEN;
CONDUCTIVITY;
D O I:
10.1016/j.colsurfa.2021.126611
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
This paper presents the electromagnetic interference (EMI) shielding and anti-corrosion characteristics of polyaniline (PANI) coated copper oxide (CuO) nanocomposites. PANI/CuO composites were characterized by X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), scanning electron microscopy (SEM), energydispersive X-ray spectroscopy, transmission electron microscopy (TEM), Raman spectroscopy, and thermogravimetry analysis (TGA). Frequency-dependent (AC) conductivity, and dielectric attributes of the composites were analyzed at room temperature in the frequency range of 10 Hz-1 MHz. The AC conductivity and dielectric properties showed tunability with varying concentrations (weight percentage) of CuO particles in PANI. The EMI shielding measurements were carried out in the Ku band (12-18 GHz) frequency range of practical relevance. The results show that, PANI/CuO composites exhibited high electromagnetic interference shielding efficiency due to high surface area and the presence of heterogeneous phase components in their moieties. The anticorrosion behavior of PANI/CuO on mild steel (MS) surface in 5 M HCl corrosive solution was performed by using the atomic absorption spectroscopy (AAS), Tafel plot, and AC impedance spectroscopy techniques. Surfacestudies were performed by using scanning electron microscopy technique. AAS results indicated that, MS corrosion mitigating efficiency of PANI/CuO nanocomposite is concentration-dependent and protection efficiency is improved with a boost in the PANI/CuO nanocomposite amount. Tafel plots confirmed that, PANI/CuO composite acts as an anodic type of inhibition system. The effect of the protective barrier invisible layer at the surface of the MS was analyzed by Nyquist plot studies and SEM topography showed the mitigation effect of the PANI/CuO system on the MS surface. Finally, our results show that, anticorrosive PANI/CuO can be a good choice for broadband microwave attenuation and EMI shielding applications.
机构:
Natl Text Univ, Sch Engn & Technol, Funct Text Res Grp, Faisalabad 38000, PakistanNatl Text Univ, Sch Engn & Technol, Funct Text Res Grp, Faisalabad 38000, Pakistan
机构:
Natl Text Univ, Sch Engn & Technol, Funct Text Res Grp, Faisalabad 38000, PakistanNatl Text Univ, Sch Engn & Technol, Funct Text Res Grp, Faisalabad 38000, Pakistan
Imran, Aqsa
Javid, Amjed
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机构:
Natl Text Univ, Sch Engn & Technol, Funct Text Res Grp, Faisalabad 38000, PakistanNatl Text Univ, Sch Engn & Technol, Funct Text Res Grp, Faisalabad 38000, Pakistan
机构:
Univ Fed Rio de Janeiro, Ctr Tecnol, PEMM COPPE, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, Ctr Tecnol, PEMM COPPE, Rio De Janeiro, RJ, Brazil
Pontes, Ketly
Indrusiak, Tamara
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h-index: 0
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Univ Fed Rio de Janeiro, Ctr Tecnol, PEMM COPPE, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, Ctr Tecnol, PEMM COPPE, Rio De Janeiro, RJ, Brazil
Indrusiak, Tamara
Soares, Bluma G.
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Univ Fed Rio de Janeiro, Ctr Tecnol, PEMM COPPE, Rio De Janeiro, RJ, Brazil
Univ Fed Rio de Janeiro, Inst Macromol, Rio De Janeiro, RJ, BrazilUniv Fed Rio de Janeiro, Ctr Tecnol, PEMM COPPE, Rio De Janeiro, RJ, Brazil
机构:
PES Univ, Dept Phys, Res Ctr Phys, South Campus, Bangalore 560100, Karnataka, IndiaMahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
Faisal, Muhammad
Wilson, Runcy
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机构:
St Cyrils Coll, Dept Chem, Adoor 691529, Kerala, IndiaMahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
Wilson, Runcy
Chandran, Anoop
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St Cyrils Coll, Dept Phys, Adoor 691529, Kerala, IndiaMahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
Chandran, Anoop
Biju, P. R.
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Mahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, IndiaMahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
Biju, P. R.
Joseph, Cyriac
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机构:
Mahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, IndiaMahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
Joseph, Cyriac
Unnikrishnan, N. V.
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机构:
Mahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, IndiaMahatma Gandhi Univ, Sch Pure & Appl Phys, Kottayam 686560, Kerala, India
机构:
BS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, IndiaBS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India
Muzaffar, Aqib
Ahamed, M. Basheer
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BS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, IndiaBS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India
Ahamed, M. Basheer
Deshmukh, Kalim
论文数: 0引用数: 0
h-index: 0
机构:
Univ West Bohemia, New Technol Res Ctr, Univ 8, Plzen 30614, Czech RepublicBS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India
Deshmukh, Kalim
Faisal, Mohammad
论文数: 0引用数: 0
h-index: 0
机构:
PES Inst Technol, Dept Sci & Humanities, South Campus, Bangalore 560100, Karnataka, IndiaBS Abdur Rahman Crescent Inst Sci & Technol, Dept Phys, Chennai 600048, Tamil Nadu, India