Structural and optical properties of CdSe0.2Te0.8 thin films prepared by radio frequency magnetron sputtering

被引：2
|
作者：
He, Guangqiang [1 ]
Xiong, Zhihui [1 ,2 ]
Yang, Hui [1 ]
Yang, Ming [1 ]
Li, Zhixi [1 ]
Zeng, Tixian [1 ]
An, Xinyou [1 ]
Zhang, Min [1 ]
机构：
[1] China West Normal Univ, Coll Phys & Space Sci, Nanchong 637000, Peoples R China
[2] Chengdu Normal Univ, Coll Phys & Engn Technol, Chengdu 611130, Peoples R China
来源：
MATERIALS LETTERS | 2021年 / 288卷
基金：
中国国家自然科学基金;
关键词：
CdSe0.2Te0.8; films; Magnetron sputtering; Photovoltaic application; UV-VIS-NIR spectroscopy; SOLAR-CELL; DEPOSITION; SUBSTRATE; THICKNESS; GROWTH;
D O I：
10.1016/j.matlet.2021.129320
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of cadmium chalcogenide (CdSe0.2Te0.8) on glass substrates have been obtained by the radio frequency magnetron sputtering with different thickness. The XRD analysis indicates that the films are cubic zinc-blende structure with no secondary phases. The UV-VIS-NIR results show that the band gap of CdSe0.2Te0.8 varied slightly in the range 1.41-1.43 eV with the film thickness. The as-prepared CdSe0.2Te0.8 could serve as a photovoltaic absorption layer in ultra-thin solar cells. (C) 2021 Elsevier B.V. All rights reserved.
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页数：4
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