An improved projector calibration method for structured-light 3D measurement systems

In a structured-light three-dimensional measurement system, understanding the optical configuration of the projector and suppressing the eccentricity error caused by the camera perspective projection are critical to realize high-precision measurement. In this paper, we analyze the special offset optical structure in commercial projectors, where a larger diameter lens is used to ensure the quality of the projected image, and the position of the principal point has been shifted. Meanwhile, a projector calibration strategy that makes the camera's optical axis perpendicular to the target plane is proposed to avoid the pollution of perspective projection distortion. The sub-pixel correspondence based on homography transformation is performed by relying on the phase value of the fringe, and bundle adjustment optimization is used to further improve the accuracy and robustness of projector calibration. The experimental results demonstrate that the proposed calibration method can improve the calibration accuracy by 52.52%.