Variable angle XAFS study of multilayer nanostructure: Determination of selective concentration profile and depth-dependent partial atomic distributions

被引：7

作者：

Babanov, Yuri ^{[1
]}

Salamatov, Yuri ^{[1
]}

Mukhamedzhanov, Enver

机构：

[1] Russian Acad Sci, Inst Met Phys, Ekaterinburg 620041, Russia

来源：

14TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE (XAFS14), PROCEEDINGS | 2009年 / 190卷

关键词：

FLUORESCENCE;

D O I：

10.1088/1742-6596/190/1/012030

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We propose a new method for studying multilayer structure using angle resolved extended x-ray absorption fine structure (EXAFS) measurements. The linear integral equation describing a connection between the fluorescence intensity for spectrum of element C, the incident beam energy E, the incident angle phi and the concentration profile p(z, C) has been derived. It is a Fredholm integral equation of the first kind, it belongs to the class of ill-posed problems and for solution it needs special methods. We use the regularization method. For determining the depth-dependent partial interatomic distances we use angle resolved EXAFS data. The effectiveness of the method has been tested during numerical simulation on the model crystalline three-layer with BCC structure: Cr/Fe/Cr.

引用

页数：6