Statistical modeling of cross-coupling effects in VLSI interconnects

被引：5

作者：

Agarwal, Mridul ^{[1
]}

Agarwal, Kanak ^{[1
]}

Sylvester, Dennis ^{[1
]}

Blaauw, David ^{[1
]}

机构：

[1] Indian Inst Technol, Kanpur 208016, Uttar Pradesh, India

来源：

ASP-DAC 2005: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2 | 2005年

关键词：

D O I：

10.1145/1120725.1120922

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we develop an approach for statistical modeling of crosstalk noise and dynamic delay degradation in coupled RC interconnects under process variations. The proposed model enables closed-form computation of mean and variance of noise peak and worst case dynamic delay for given variabilities in physical dimensions. We compare the proposed model against HSPICE Monte Carlo simulations and report an average error in mean and standard deviation of noise peak to be 2.7% and 3.7% respectively.

引用

页码：503 / 506

页数：4

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