The nanoscale structure of the B and Iw phases in yttrium and erbium SiAlONs

被引：0

作者：

MacLaren, I ^{[1
]}

Falk, LKL

Menke, Y

Diaz, A

Hampshire, S

Parmentier, J

Thompson, DP

机构：

[1] Chalmers Univ Technol, Dept Expt Phys, SE-41296 Gothenburg, Sweden

[2] Univ Gothenburg, SE-41296 Gothenburg, Sweden

[3] Univ Limerick, Ceram Res Unit, Limerick, Ireland

[4] Univ Newcastle Upon Tyne, Dept Mech Mat & Mfg Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England

来源：

ELECTRON MICROSCOPY AND ANALYSIS 1999 | 1999年 / 161期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

High resolution electron microscopy has been used to examine the nanoscale structure of the related B and I-w phases in Y and Er SiAlONs. B-phase was found to consist of nanoscale domains with a lower symmetry than the average hexagonal symmetry. The monoclinic cell of I-w can be clearly imaged by HREM and work is in progress to use these images in the determination of atomic positions in the unit cell. One consequence of the ordered structure of I-w is the possibility of forming domain boundaries, and two of the three possible types of domain boundaries have now been imaged using HREM.

引用

页码：153 / 156

页数：4