Strain state evolution and thickness-dependent properties of epitaxial Nd0.7Sr0.3MnO3 films

被引：15

作者：

Jin, S. W. ^{[1
]}

Gao, G. Y.

Yin, Z. Z.

Huang, Z.

Zhou, X. Y.

Wu, W. B.

机构：

[1] Univ Sci & Technol China, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Peoples R China

[2] Univ Sci & Technol China, Dept Modern Phys, Hefei 230026, Peoples R China

来源：

PHYSICAL REVIEW B | 2007年 / 75卷 / 21期

关键词：

D O I：

10.1103/PhysRevB.75.212401

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nd0.7Sr0.3MnO3 (NSMO) films 7-300 nm thick have been grown on (001)(LaAlO3)(0.3)(Sr2AlTaO6)(0.7) (LSAT) and (001)SrTiO3 (STO) substrates, with lattice mismatches of 0.33% and 1.29%, respectively. The strain state evolution was examined fully by x-ray reciprocal space maps, in order to clarify its impact on the thickness-dependent properties of the films. It was found that all NSMO/LSAT films are coherently strained, having almost the same Curie (T-C) and peak resistivity (T-p) temperatures at fixed thicknesses, while the NSMO/STO films evolve from being fully strained to relaxed, showing inhomogeneous magnetic transitions and lower or higher T-C than their counterparts at 7-60 nm. The results underline that T-C (T-p) and phase separation are all controlled by the strain states of the films.

引用

页数：4

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