Modeling of the interface formation during CuO deposition on Al(111) substrate: linking material design and elaboration process parameters through multi-levels approach

被引:1
作者
Guiltat, M. [1 ]
Salles, N. [1 ]
Brut, M. [1 ]
Landa, G. [1 ]
Richard, N. [2 ]
Vizzini, S. [3 ]
Hemeryck, A. [1 ]
机构
[1] Univ Toulouse, LAAS CNRS, CNRS, UPS, Toulouse, France
[2] CEA DAM DIF, F-91297 Arpajon, France
[3] Aix Marseille Univ, Fac Sci St Jereme, IM2NP, F-13397 Marseille, France
关键词
interface; kinetics; nanostructuring; growth; design; multi-level modeling; atomic scale calculations; TOTAL-ENERGY CALCULATIONS; AUGMENTED-WAVE METHOD; BASIS-SET; ALUMINUM; GROWTH; OXYGEN; CHEMISTRY; DIFFUSION; KINETICS; POINTS;
D O I
10.1088/1361-651X/aa7bbc
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, we use a multi-levels modeling approach to describe the elaboration of directly integrated energetic materials. The deposition of copper oxide on aluminum substrate is described. Atomic scale calculations are first conducted to identify local mechanisms involved during the growth of CuO on Al(111). These atomic scale data are then used to parameterize a macroscopic code, inspired on a kinetic Monte Carlo methodology dedicated to simulate vapor like deposition process. The objective is to establish the link between the microstructure of materials and the way they are achieved, i.e. the process parameters such as temperature and gas pressure. This work is conducted in the context of the integration of nano-structured energetic thermites used as micro energy source in microelectronic devices. We show that the temperature of the deposition process appears as the driving parameter to tailor the thickness of interfacial layers.
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页数:17
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