Budding yeast DNA damage adaptation mutants exhibit defects in mitotic exit

被引:7
|
作者
Jin, Fengzhi [1 ]
Wang, Yanchang [1 ]
机构
[1] Florida State Univ, Coll Med, Dept Biomed Sci, Tallahassee, FL 32306 USA
关键词
DNA damage; adaptation; mitotic exit; Cdc5; FEAR;
D O I
10.4161/cc.5.24.3570
中图分类号
Q2 [细胞生物学];
学科分类号
071009 ; 090102 ;
摘要
In the presence of double strand breaks, DNA damage checkpoint halts cell cycle progression. However, cells ultimately escape the checkpoint arrest and reenter cell cycle in the presence of irreparable DNA damage. cdc5-ad was identified as a mutant that fails to adapt to the cell cycle arrest induced by DNA damage checkpoint. In budding yeast, Cdc5 protein kinase is a component of both MEN and FEAR pathways that are required for mitotic exit. It remains unclear whether the adaptation defect of cdc5-ad mutant cells is related to the function of Cdc5 in mitotic exit. Here we present evidence indicating that cdc5-ad mutant cells exhibit defects in mitotic exit. cdc5-ad mutant cells are sensitive to high dosage of Amn1, a negative regulator of MEN. It also shows synthetic growth defects with mutants in MEN pathway. Moreover, mutants in FEAR pathway exhibit defects in DNA damage adaptation. Thus, we conclude that the compromised mitotic exit pathway contributes to DNA damage adaptation defects in cdc5-ad mutant cells.
引用
收藏
页码:2914 / 2919
页数:6
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