Accelerated pre-oxidation method for healing progressive electrical short in organic light-emitting devices

The accelerated pre-oxidation method (APOM) was applied to heal progressive electrical short (PES) in organic light-emitting devices. The APOM applied to the devices showed approximately 100 times lower leakage current and 25% improvement in device efficiency compared to a normal device without the APOM applied. The mean projected lifetime of the APOM devices was more than 2400 h at initial luminance of 100 cd/m(2) and 90 degreesC, whereas the normal device turned off after 15 h of operation at the same temperature due to the PES phenomenon. The best stability at elevated temperature was achieved by using the APOM for the cathode layer. (C) 2003 American Institute of Physics.