Accurate Modeling Noise Characteristic of Microwave Field-Effect Transistor

被引：0
作者：
Xu, Yuehang [1 ]
Guo, Yunchuan [1 ]
Wu, Yunqiu [1 ]
Xu, Ruimin [1 ]
Yan, Bo [1 ]
机构：
[1] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 610054, Peoples R China
来源：
APMC: 2008 ASIA PACIFIC MICROWAVE CONFERENCE (APMC 2008), VOLS 1-5 | 2008年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：198 / 201
页数：4
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