X-ray diffraction study of mixed-layer compounds in the pseudobinary system SnTe-Bi2Te3

被引：28

作者：

Karpinskii, OG ^{[1
]}

Shelimova, LE ^{[1
]}

Kretova, MA ^{[1
]}

Avilov, ES ^{[1
]}

Zemskov, VS ^{[1
]}

机构：

[1] Russian Acad Sci, Baikov Inst Met & Mat Res, Moscow 117911, Russia

来源：

INORGANIC MATERIALS | 2003年 / 39卷 / 03期

基金：

俄罗斯基础研究基金会;

关键词：

Inorganic Chemistry; Phase Diagram; Structural Data; Early Result; Diffraction Study;

D O I：

10.1023/A:1022669323255

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray diffraction studies of cleaved single-crystal specimens and powders demonstrate that the SnTe-Bi2Te3 system contains a homologous series of nSnTe . mBi(2)Te(3) layered compounds (n = 1, 2; m = 1-3). In addition to the known compound SnBi2Te4, the compounds SnBi4Te7 (n = 1, m = 2) and SnBi6Te10 (n = 1, m = 3), structural analogues of GeBi4Te7 and GeBi6Te10, are identified. SnBi4Te7 has a 12-layer structure with lattice parameters a = 0.4392(1) nm and c = 2.399(1) nm (sp. gr. P3m1). SnBi6Te10 has a 51-layer structure with a = 0.4391 (1) nm and c = 10.264(5) nm (sp. gr. R3m). The new structural data for nSnTe . mBi(2)Te(3) compounds and earlier results are used to reassess the SnTe-Bi2Te3 phase diagram.

引用

页码：240 / 246

页数：7

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