Hard X-ray photoelectron spectroscopy from 5-14.5 keV

被引：49

作者：

Thiess, S

Kunz, C

Cowie, BCC

Lee, TL

Renier, M

Zegenhagen, J

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] Univ Hamburg, Inst Phys Expt, D-22761 Hamburg, Germany

来源：

SOLID STATE COMMUNICATIONS | 2004年 / 132卷 / 09期

关键词：

surfaces and interfaces; photoelectric cross-section; synchrotron radiation; X-ray and X-ray spectroscopies; photoelectron spectroscopies;

D O I：

10.1016/j.ssc.2004.09.021

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Photoemission spectroscopy at high energies can be used to probe bulk electronic states. We used a specially designed high-voltage retarding lens and a commercial Perkin-Elmer PHI 10-360 hemispherical electron analyzer to investigate the core and valence band region of Au, YBa2CU3O7-delta and highly oriented pyrolytic graphite samples with hard X-rays in the energy range 15-14.5 keV. The overall instrumental resolution obtained at 8 keV was 218 meV. The photo ionization cross-sections for Au 5d and 6s excitations were determined experimentally. In comparison with published calculations for atomic cross-sections neglecting corrections for angular anisotropy, the values we find are twice as large for the 5d and an order of magnitude larger for the 6s (conduction band) level. Our results demonstrate the feasibility of bulk sensitive valence band spectroscopy with high resolution at high brilliance X-ray sources such as the ESRF. The measured cross-sections provide important input for improving current theoretical models. (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：589 / 594

页数：6

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