Longitudinal Proximity Effects in Superconducting Transition-Edge Sensors

被引：99

作者：

Sadleir, John E. ^{[1
,2
]}

Smith, Stephen J. ^{[2
]}

Bandler, Simon R. ^{[2
]}

Chervenak, James A. ^{[2
]}

Clem, John R. ^{[3
,4
]}

机构：

[1] Univ Illinois, Dept Phys, Urbana, IL 61801 USA

[2] NASA, Goddard Space Flight Ctr, Greenbelt, MD USA

[3] Iowa State Univ, Ames Lab, Ames, IA 50011 USA

[4] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA

来源：

PHYSICAL REVIEW LETTERS | 2010年 / 104卷 / 04期

关键词：

X-RAY MICROCALORIMETERS; NOISE; SUPERCURRENTS; SANDWICHES; DETECTORS;

D O I：

10.1103/PhysRevLett.104.047003

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have found experimentally that the critical current of a square thin-film superconducting transition-edge sensor (TES) depends exponentially upon the side length L and the square root of the temperature T, a behavior that has a natural theoretical explanation in terms of longitudinal proximity effects if the TES is regarded as a weak link between superconducting leads. As a consequence, the effective transition temperature T-c of the TES is current dependent and at fixed current scales as 1/L-2. We have also found that the critical current can show clear Fraunhofer-like oscillations in an applied magnetic field, similar to those found in Josephson junctions. We have observed the longitudinal proximity effect in these devices over extraordinarily long lengths up to 290 mu m, 1450 times the mean-free path.

引用

页数：4

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