共 37 条
- [22] Study of gate length dependence of two-dimensional carrier profile in N-FET by scanning tunneling microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (4B): : 2395 - 2399
- [25] DYNAMIC OBSERVATION OF AG DESORPTION PROCESS ON SI(111) SURFACE BY HIGH-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (6B): : 2923 - 2928