Plasma cleaning of lithium off of collector optics material for use in extreme ultraviolet lithography applications

被引:2
作者
Neumann, Martin J.
DeFrees, Reece A.
Qiu, Huatan
Ruzic, David N.
Khodykin, Oleh
Ershov, Alex
Bristol, Robert L.
机构
[1] Univ Illinois, Dept Nucl Plasma & Radiol Engn, Urbana, IL 61801 USA
[2] Cymer Corp, San Diego, CA 92127 USA
[3] Intel Corp, Components Res, Hillsboro, OR 97123 USA
来源
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 2007年 / 6卷 / 02期
关键词
extreme ultraviolet; mirrors; optics; lithography; plasmas; reflectivity;
D O I
10.1117/1.2750651
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the critical issues within extreme ultraviolet lithography. is mirror lifetime and the degradation due to debris from the pinch. This. research investigated and showed the efficacy of using a helium secondary plasma and heat for. removal of Li debris from collecting on the sur. face of collector optics. A He helicon plasma, which minimizes self-biasing and sputtering, has good extreme ultraviolet (EUV) photon wavelength transmission and preferential sputtering of lithium compared to other collector optics material. Through the combined use of heating and a He secondary plasma, EUV collector sample surface roughness, and surface composition was able to be maintained near as-received status. The use of the He secondary plasma while the collector optics sample is exposed to Li debris shows promise as an in situ cleaning process for collector optics and can extend the lifetime of collector Optics. (c) 2007 Society of Photo-Optical Instrumentation Engineers.
引用
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页数:6
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