Microcrystallography with an X-ray waveguide

被引：47
作者：
Müller, M
Burghammer, M
Flot, D
Riekel, C
Morawe, C
Murphy, B
Cedola, A
机构：
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] CLRC, Daresbury Lab, Warrington WA4 4AD, Cheshire, England
[3] Ist Elettr Stato Solido, I-00156 Rome, Italy
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2000年 / 33卷
关键词：
D O I：
10.1107/S0021889800009249
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
A waveguide microdiffraction setup is described for an undulator beamline at the European Synchrotron Radiation Facility. The composite optics consists of a waveguide, which confines the beam vertically, and a horizontally focusing multilayer mirror. A beam size of about 0.1 x 3 mu m (vertical x horizontal) at lambda = 0.095 nm has been obtained. The sample stage comprises a three-axis gantry with micrometre precision and a three-axis piezo-scanner with about 0.1 mu m repeatability. Diffraction experiments are demonstrated for selected inorganic and polymeric samples. Possibilities for scanning diffractometry and small-angle scattering experiments are discussed.
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页码：1231 / 1240
页数：10
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