Lasing on scar modes in fully chaotic microcavities

被引：63

作者：

Harayama, T ^{[1
]}

Fukushima, T ^{[1
]}

Davis, P ^{[1
]}

Vaccaro, PO ^{[1
]}

Miyasaka, T ^{[1
]}

Nishimura, T ^{[1
]}

Aida, T ^{[1
]}

机构：

[1] ATR Adapt Commun Res Labs, Seika, Kyoto 6190228, Japan

来源：

PHYSICAL REVIEW E | 2003年 / 67卷 / 01期

关键词：

D O I：

10.1103/PhysRevE.67.015207

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Scar wave functions in a fully chaotic cavity are obtained numerically by an extended Fox-Li method. Lasing on the scar modes are observed in a semiconductor microcavity with a selective excitation of different scars controlled by corresponding shape of electrodes for current injection.

引用

页数：4

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